Terahertz Materials Characterization Laboratory

The primary focus of the Terahertz Materials Characterization Lab is developing terahertz based material characterization techniques relevant to the PV and semiconductor industries. An example of a metrology under development in our lab is the non-destructive and non-contact measurement of doping profiles in silicon. Another project of significant interest to the PV industry is the development of a free carrier lifetime measurement technique capable of measuring lifetimes from 10 nanoseconds up to 1 millisecond.  Our group is also active in the area of electrochemical fabrication of nanomaterials. We recently reported a breakthrough in this field by identifying the mechanism for poor conductivity in titanium dioxide nanotubes using terahertz spectroscopy (highlighted in the journal Science, Nov. 2010).